Hierarchical DFT with enhancements for AC scan, test scheduling and on-chip compression - a case study - researchr publication authors

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Jeff Remmers, Darin Lee, Richard Fisette. Hierarchical DFT with enhancements for AC scan, test scheduling and on-chip compression - a case study. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]

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