Jeff Remmers, Darin Lee, Richard Fisette. Hierarchical DFT with enhancements for AC scan, test scheduling and on-chip compression - a case study. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{RemmersLF05, title = {Hierarchical DFT with enhancements for AC scan, test scheduling and on-chip compression - a case study}, author = {Jeff Remmers and Darin Lee and Richard Fisette}, year = {2005}, doi = {10.1109/TEST.2005.1584034}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584034}, researchr = {https://researchr.org/publication/RemmersLF05}, cites = {0}, citedby = {0}, pages = {9}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }