A Vertical Outlier Detection Algorithm with Clusters as By-Product

Dongmei Ren, Imad Rahal, William Perrizo. A Vertical Outlier Detection Algorithm with Clusters as By-Product. In 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2004), 15-17 November 2004, Boca Raton, FL, USA. pages 22-29, IEEE Computer Society, 2004. [doi]

Authors

Dongmei Ren

This author has not been identified. Look up 'Dongmei Ren' in Google

Imad Rahal

This author has not been identified. Look up 'Imad Rahal' in Google

William Perrizo

This author has not been identified. Look up 'William Perrizo' in Google