A Vertical Outlier Detection Algorithm with Clusters as By-Product

Dongmei Ren, Imad Rahal, William Perrizo. A Vertical Outlier Detection Algorithm with Clusters as By-Product. In 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2004), 15-17 November 2004, Boca Raton, FL, USA. pages 22-29, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.