Dongmei Ren, Imad Rahal, William Perrizo. A Vertical Outlier Detection Algorithm with Clusters as By-Product. In 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2004), 15-17 November 2004, Boca Raton, FL, USA. pages 22-29, IEEE Computer Society, 2004. [doi]
@inproceedings{RenRP04,
title = {A Vertical Outlier Detection Algorithm with Clusters as By-Product},
author = {Dongmei Ren and Imad Rahal and William Perrizo},
year = {2004},
doi = {10.1109/ICTAI.2004.22},
url = {http://doi.ieeecomputersociety.org/10.1109/ICTAI.2004.22},
researchr = {https://researchr.org/publication/RenRP04},
cites = {0},
citedby = {0},
pages = {22-29},
booktitle = {16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2004), 15-17 November 2004, Boca Raton, FL, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2236-X},
}