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Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life

Pengpeng Ren, Runsheng Wang, Ru Huang. Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life. In International Conference on IC Design and Technology, ICICDT 2016, Ho Chi Minh, Vietnam, June 27-29, 2016. pages 1-3, IEEE, 2016. [doi]

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Pengpeng Ren

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Runsheng Wang

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Ru Huang

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