Pengpeng Ren, Runsheng Wang, Ru Huang. Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life. In International Conference on IC Design and Technology, ICICDT 2016, Ho Chi Minh, Vietnam, June 27-29, 2016. pages 1-3, IEEE, 2016. [doi]
@inproceedings{RenWH16,
title = {Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life},
author = {Pengpeng Ren and Runsheng Wang and Ru Huang},
year = {2016},
doi = {10.1109/ICICDT.2016.7542063},
url = {http://dx.doi.org/10.1109/ICICDT.2016.7542063},
researchr = {https://researchr.org/publication/RenWH16},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {International Conference on IC Design and Technology, ICICDT 2016, Ho Chi Minh, Vietnam, June 27-29, 2016},
publisher = {IEEE},
isbn = {978-1-5090-0827-8},
}