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Fast Defect Inspection Based on Data-Driven Photometric Stereo

Mingjun Ren, Xi Wang, Gaobo Xiao, Minghan Chen, Lin Fu. Fast Defect Inspection Based on Data-Driven Photometric Stereo. IEEE T. Instrumentation and Measurement, 68(4):1148-1156, 2019. [doi]

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Mingjun Ren

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Xi Wang

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Gaobo Xiao

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Minghan Chen

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Lin Fu

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