Fast Defect Inspection Based on Data-Driven Photometric Stereo

Mingjun Ren, Xi Wang, Gaobo Xiao, Minghan Chen, Lin Fu. Fast Defect Inspection Based on Data-Driven Photometric Stereo. IEEE T. Instrumentation and Measurement, 68(4):1148-1156, 2019. [doi]

Abstract

Abstract is missing.