Mingjun Ren, Xi Wang, Gaobo Xiao, Minghan Chen, Lin Fu. Fast Defect Inspection Based on Data-Driven Photometric Stereo. IEEE T. Instrumentation and Measurement, 68(4):1148-1156, 2019. [doi]
@article{RenWXCF19, title = {Fast Defect Inspection Based on Data-Driven Photometric Stereo}, author = {Mingjun Ren and Xi Wang and Gaobo Xiao and Minghan Chen and Lin Fu}, year = {2019}, doi = {10.1109/TIM.2018.2858062}, url = {https://doi.org/10.1109/TIM.2018.2858062}, researchr = {https://researchr.org/publication/RenWXCF19}, cites = {0}, citedby = {0}, journal = {IEEE T. Instrumentation and Measurement}, volume = {68}, number = {4}, pages = {1148-1156}, }