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A control-based approach to indentation quantification in broadband and in-liquid nanomechanical measurement using atomic force microscope

Juan Ren, Qingze Zou. A control-based approach to indentation quantification in broadband and in-liquid nanomechanical measurement using atomic force microscope. In American Control Conference, ACC 2012, Montreal, QC, Canada, June 27-29, 2012. pages 3234-3239, IEEE, 2012. [doi]

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