Pengpeng Ren, Xinfa Zhang, Junhua Liu, Runsheng Wang, Zhigang Ji, Ru Huang. Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3, IEEE, 2022. [doi]
@inproceedings{RenZLWJH22,
title = {Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications},
author = {Pengpeng Ren and Xinfa Zhang and Junhua Liu and Runsheng Wang and Zhigang Ji and Ru Huang},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764579},
url = {https://doi.org/10.1109/IRPS48227.2022.9764579},
researchr = {https://researchr.org/publication/RenZLWJH22},
cites = {0},
citedby = {0},
pages = {3},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}