Pengpeng Ren, Xinfa Zhang, Junhua Liu, Runsheng Wang, Zhigang Ji, Ru Huang. Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3, IEEE, 2022. [doi]
Abstract is missing.