The concept of resistance interval: a new parametric model for realistic resistive bridging fault - researchr publication authors

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Michel Renovell, P. Huc, Yves Bertrand. The concept of resistance interval: a new parametric model for realistic resistive bridging fault. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 184-189, IEEE Computer Society, 1995. [doi]

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