Michel Renovell, P. Huc, Yves Bertrand. The concept of resistance interval: a new parametric model for realistic resistive bridging fault. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 184-189, IEEE Computer Society, 1995. [doi]
@inproceedings{RenovellHB95,
title = {The concept of resistance interval: a new parametric model for realistic resistive bridging fault},
author = {Michel Renovell and P. Huc and Yves Bertrand},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000184abs.htm},
researchr = {https://researchr.org/publication/RenovellHB95},
cites = {0},
citedby = {0},
pages = {184-189},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}