Analyzing the test generation problem for an application-oriented test of FPGAs

Michel Renovell, Jean Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian. Analyzing the test generation problem for an application-oriented test of FPGAs. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 75-80, IEEE Computer Society, 2000. [doi]

@inproceedings{RenovellPFFZ00-0,
  title = {Analyzing the test generation problem for an application-oriented test of FPGAs},
  author = {Michel Renovell and Jean Michel Portal and Penelope Faure and Joan Figueras and Yervant Zorian},
  year = {2000},
  doi = {10.1109/ETW.2000.873782},
  url = {https://doi.org/10.1109/ETW.2000.873782},
  researchr = {https://researchr.org/publication/RenovellPFFZ00-0},
  cites = {0},
  citedby = {0},
  pages = {75-80},
  booktitle = {5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0701-8},
}