Multiple errors produced by single upsets in FPGA configuration memory: a possible solution

Matteo Sonza Reorda, Luca Sterpone, Massimo Violante. Multiple errors produced by single upsets in FPGA configuration memory: a possible solution. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 136-141, IEEE, 2005. [doi]

Abstract

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