Matteo Sonza Reorda, Massimo Violante. Fault List Compaction through Static Timing Analysis for Efficient Fault Injection Experiments. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 263-274, IEEE Computer Society, 2002. [doi]
Abstract is missing.