Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models - researchr publication authors

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Matthew Repasky, Xiuyuan Cheng, Yao Xie 0002. Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models. In IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2024, Seoul, Republic of Korea, April 14-19, 2024. pages 7255-7259, IEEE, 2024. [doi]

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