Matthew Repasky, Xiuyuan Cheng, Yao Xie 0002. Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models. In IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2024, Seoul, Republic of Korea, April 14-19, 2024. pages 7255-7259, IEEE, 2024. [doi]
@inproceedings{RepaskyC024,
title = {Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models},
author = {Matthew Repasky and Xiuyuan Cheng and Yao Xie 0002},
year = {2024},
doi = {10.1109/ICASSP48485.2024.10445927},
url = {https://doi.org/10.1109/ICASSP48485.2024.10445927},
researchr = {https://researchr.org/publication/RepaskyC024},
cites = {0},
citedby = {0},
pages = {7255-7259},
booktitle = {IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2024, Seoul, Republic of Korea, April 14-19, 2024},
publisher = {IEEE},
isbn = {979-8-3503-4485-1},
}