Matthew Repasky, Xiuyuan Cheng, Yao Xie 0002. Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models. In IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2024, Seoul, Republic of Korea, April 14-19, 2024. pages 7255-7259, IEEE, 2024. [doi]
Abstract is missing.