On-line software-based self-test for ECC of embedded RAM memories

Marco Restifo, Paolo Bernardi, S. De Luca, Alessandro Sansonetti. On-line software-based self-test for ECC of embedded RAM memories. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]

@inproceedings{RestifoBLS17,
  title = {On-line software-based self-test for ECC of embedded RAM memories},
  author = {Marco Restifo and Paolo Bernardi and S. De Luca and Alessandro Sansonetti},
  year = {2017},
  doi = {10.1109/DFT.2017.8244443},
  url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2017.8244443},
  researchr = {https://researchr.org/publication/RestifoBLS17},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017},
  publisher = {IEEE},
  isbn = {978-1-5386-0362-8},
}