Marco Restifo, Paolo Bernardi, S. De Luca, Alessandro Sansonetti. On-line software-based self-test for ECC of embedded RAM memories. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{RestifoBLS17, title = {On-line software-based self-test for ECC of embedded RAM memories}, author = {Marco Restifo and Paolo Bernardi and S. De Luca and Alessandro Sansonetti}, year = {2017}, doi = {10.1109/DFT.2017.8244443}, url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2017.8244443}, researchr = {https://researchr.org/publication/RestifoBLS17}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017}, publisher = {IEEE}, isbn = {978-1-5386-0362-8}, }