Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors - researchr publication authors

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Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez, Eduardo Chielle, Fernanda Lima Kastensmidt. Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors. J. Electronic Testing, 31(2):139-150, 2015. [doi]

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