Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors

Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez, Eduardo Chielle, Fernanda Lima Kastensmidt. Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors. J. Electronic Testing, 31(2):139-150, 2015. [doi]

@article{Restrepo-CalleC15,
  title = {Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors},
  author = {Felipe Restrepo-Calle and Sergio Cuenca-Asensi and Antonio Martínez-Álvarez and Eduardo Chielle and Fernanda Lima Kastensmidt},
  year = {2015},
  doi = {10.1007/s10836-015-5513-9},
  url = {http://dx.doi.org/10.1007/s10836-015-5513-9},
  researchr = {https://researchr.org/publication/Restrepo-CalleC15},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {31},
  number = {2},
  pages = {139-150},
}