Smart Sensing of Multi-bit Resistive Memory using a Single Reference

John Reuben, Dietmar Fey. Smart Sensing of Multi-bit Resistive Memory using a Single Reference. In 28th Euromicro Conference on Digital System Design, DSD 2025, Salerno, Italy, September 10-12, 2025. pages 410-417, IEEE, 2025. [doi]

Authors

John Reuben

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Dietmar Fey

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