John Reuben, Dietmar Fey. Smart Sensing of Multi-bit Resistive Memory using a Single Reference. In 28th Euromicro Conference on Digital System Design, DSD 2025, Salerno, Italy, September 10-12, 2025. pages 410-417, IEEE, 2025. [doi]
@inproceedings{ReubenF25,
title = {Smart Sensing of Multi-bit Resistive Memory using a Single Reference},
author = {John Reuben and Dietmar Fey},
year = {2025},
doi = {10.1109/DSD67783.2025.00063},
url = {https://doi.org/10.1109/DSD67783.2025.00063},
researchr = {https://researchr.org/publication/ReubenF25},
cites = {0},
citedby = {0},
pages = {410-417},
booktitle = {28th Euromicro Conference on Digital System Design, DSD 2025, Salerno, Italy, September 10-12, 2025},
publisher = {IEEE},
isbn = {979-8-3315-8499-3},
}