Fault-based product-line testing: effective sample generation based on feature-diagram mutation - researchr publication authors

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Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau, Udo Kelter. Fault-based product-line testing: effective sample generation based on feature-diagram mutation. In Douglas C. Schmidt, editor, Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015. pages 131-140, ACM, 2015. [doi]

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