Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau, Udo Kelter. Fault-based product-line testing: effective sample generation based on feature-diagram mutation. In Douglas C. Schmidt, editor, Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015. pages 131-140, ACM, 2015. [doi]
@inproceedings{ReulingBRLK15,
title = {Fault-based product-line testing: effective sample generation based on feature-diagram mutation},
author = {Dennis Reuling and Johannes Bürdek and Serge Rotärmel and Malte Lochau and Udo Kelter},
year = {2015},
doi = {10.1145/2791060.2791074},
url = {http://doi.acm.org/10.1145/2791060.2791074},
researchr = {https://researchr.org/publication/ReulingBRLK15},
cites = {0},
citedby = {0},
pages = {131-140},
booktitle = {Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015},
editor = {Douglas C. Schmidt},
publisher = {ACM},
isbn = {978-1-4503-3613-0},
}