Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology - researchr publication authors

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Yannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix. Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectronics Reliability, 45(9-11):1349-1354, 2005. [doi]

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