Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud. High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. Microelectronics Reliability, 41(9-10):1707-1712, 2001. [doi]
@article{Rey-TauriacTB01a,
title = {High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology},
author = {Yannick Rey-Tauriac and M. Taurin and Olivier Bonnaud},
year = {2001},
doi = {10.1016/S0026-2714(01)00204-9},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00204-9},
researchr = {https://researchr.org/publication/Rey-TauriacTB01a},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1707-1712},
}