High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology

Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud. High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology. Microelectronics Reliability, 41(9-10):1707-1712, 2001. [doi]

Abstract

Abstract is missing.