The following publications are possibly variants of this publication:
- Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technologyYannick Rey-Tauriac, O. de Sagazan, M. Taurin, Olivier Bonnaud. mr, 43(9-11):1865-1869, 2003. [doi]
- Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technologyYannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix. mr, 45(9-11):1349-1354, 2005. [doi]
- Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOSYannick Rey-Tauriac, M. Taurin, Olivier Bonnaud. mr, 41(9-10):1331-1334, 2001.