Juan C. Rey. Physical Verification at Advanced Technology Nodes and the Road Ahead. In William Swartz, Jens Lienig, editors, ISPD 2020: International Symposium on Physical Design, Taipei, Taiwan, March 29 - April 1, 2020, delayed to September 20-23, 2020. pages 143, ACM, 2020. [doi]
Abstract is missing.