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Experimental analysis of electro-thermal instability in SiC Power MOSFETs

Michele Riccio, Alberto Castellazzi, G. De Falco, Andrea Irace. Experimental analysis of electro-thermal instability in SiC Power MOSFETs. Microelectronics Reliability, 53(9-11):1739-1744, 2013. [doi]

Authors

Michele Riccio

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Alberto Castellazzi

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G. De Falco

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Andrea Irace

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