Experimental analysis of electro-thermal instability in SiC Power MOSFETs

Michele Riccio, Alberto Castellazzi, G. De Falco, Andrea Irace. Experimental analysis of electro-thermal instability in SiC Power MOSFETs. Microelectronics Reliability, 53(9-11):1739-1744, 2013. [doi]

Abstract

Abstract is missing.