Michele Riccio, Alberto Castellazzi, G. De Falco, Andrea Irace. Experimental analysis of electro-thermal instability in SiC Power MOSFETs. Microelectronics Reliability, 53(9-11):1739-1744, 2013. [doi]
@article{RiccioCFI13,
title = {Experimental analysis of electro-thermal instability in SiC Power MOSFETs},
author = {Michele Riccio and Alberto Castellazzi and G. De Falco and Andrea Irace},
year = {2013},
doi = {10.1016/j.microrel.2013.07.014},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.014},
researchr = {https://researchr.org/publication/RiccioCFI13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1739-1744},
}