M. Riccio, Lucio Rossi, Andrea Irace, E. Napoli, Giovanni Breglio, Paolo Spirito, R. Tagami, Y. Mizuno. Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. Microelectronics Reliability, 50(9-11):1725-1730, 2010. [doi]
@article{RiccioRINBSTM10,
title = {Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography},
author = {M. Riccio and Lucio Rossi and Andrea Irace and E. Napoli and Giovanni Breglio and Paolo Spirito and R. Tagami and Y. Mizuno},
year = {2010},
doi = {10.1016/j.microrel.2010.07.072},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.072},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/RiccioRINBSTM10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1725-1730},
}