M. Riccio, Lucio Rossi, Andrea Irace, E. Napoli, Giovanni Breglio, Paolo Spirito, R. Tagami, Y. Mizuno. Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. Microelectronics Reliability, 50(9-11):1725-1730, 2010.
No references recorded for this publication.
No citations of this publication recorded.