Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker. An effective approach to automatic functional processor test generation for small-delay faults. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.