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A detailed methodology to compute Soft Error Rates in advanced technologies

Marc Riera, Ramon Canal, Jaume Abella, Antonio González 0001. A detailed methodology to compute Soft Error Rates in advanced technologies. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 217-222, IEEE, 2016. [doi]

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Marc Riera

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Ramon Canal

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Jaume Abella

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Antonio González 0001

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