Marc Riera, Ramon Canal, Jaume Abella, Antonio González 0001. A detailed methodology to compute Soft Error Rates in advanced technologies. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 217-222, IEEE, 2016. [doi]
@inproceedings{RieraCA016,
title = {A detailed methodology to compute Soft Error Rates in advanced technologies},
author = {Marc Riera and Ramon Canal and Jaume Abella and Antonio González 0001},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459307},
researchr = {https://researchr.org/publication/RieraCA016},
cites = {0},
citedby = {0},
pages = {217-222},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}