Matteo Rigato, Clément Fleury, Michael Heer, Mattia Capriotti, Werner Simbürger, Dionyz Pogany. ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique. Microelectronics Reliability, 55(9-10):1471-1475, 2015. [doi]
@article{RigatoFHCSP15,
title = {ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique},
author = {Matteo Rigato and Clément Fleury and Michael Heer and Mattia Capriotti and Werner Simbürger and Dionyz Pogany},
year = {2015},
doi = {10.1016/j.microrel.2015.06.019},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.019},
researchr = {https://researchr.org/publication/RigatoFHCSP15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {1471-1475},
}