High Resolution I::DDQ:: Characterization and Testing - Practical Issues - researchr publication authors

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Alan W. Righter, Jerry M. Soden, Richard W. Beegle. High Resolution I::DDQ:: Characterization and Testing - Practical Issues. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 259-268, IEEE Computer Society, 1996.

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