Marcus Rimén, Joakim Ohlsson. A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 696-704, IEEE Computer Society, 1992.
@inproceedings{RimenO92,
title = {A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection},
author = {Marcus Rimén and Joakim Ohlsson},
year = {1992},
researchr = {https://researchr.org/publication/RimenO92},
cites = {0},
citedby = {0},
pages = {696-704},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}