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A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection

Marcus Rimén, Joakim Ohlsson. A Study of the Error Behavior of a 32-bit RISC Subjected to Simulated Transient Fault Injection. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 696-704, IEEE Computer Society, 1992.

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