Raphael Robertazzi, Louis Medina, Ernesto Shiling, Garry Moore, Ronald Geiger, Jiun-Hsin Liao, John Williamson. New tools and methodology for advanced parametric and defect structure test. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 19-28, IEEE, 2010. [doi]
@inproceedings{RobertazziMSMGLW10,
title = {New tools and methodology for advanced parametric and defect structure test},
author = {Raphael Robertazzi and Louis Medina and Ernesto Shiling and Garry Moore and Ronald Geiger and Jiun-Hsin Liao and John Williamson},
year = {2010},
doi = {10.1109/TEST.2010.5699201},
url = {http://dx.doi.org/10.1109/TEST.2010.5699201},
researchr = {https://researchr.org/publication/RobertazziMSMGLW10},
cites = {0},
citedby = {0},
pages = {19-28},
booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
editor = {Ron Press and Erik H. Volkerink},
publisher = {IEEE},
isbn = {978-1-4244-7206-2},
}