Raphael Robertazzi, Louis Medina, Ernesto Shiling, Garry Moore, Ronald Geiger, Jiun-Hsin Liao, John Williamson. New tools and methodology for advanced parametric and defect structure test. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 19-28, IEEE, 2010. [doi]
Abstract is missing.