Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems

Iain Robertson, Graham Hetherington, Tom Leslie, Ishwar Parulkar, Ronald Lesnikoski. Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]

@inproceedings{RobertsonHLPL05,
  title = {Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems},
  author = {Iain Robertson and Graham Hetherington and Tom Leslie and Ishwar Parulkar and Ronald Lesnikoski},
  year = {2005},
  doi = {10.1109/TEST.2005.1584065},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584065},
  researchr = {https://researchr.org/publication/RobertsonHLPL05},
  cites = {0},
  citedby = {0},
  pages = {8},
  booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
  publisher = {IEEE},
  isbn = {0-7803-9038-5},
}