Iain Robertson, Graham Hetherington, Tom Leslie, Ishwar Parulkar, Ronald Lesnikoski. Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]
Abstract is missing.