Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira. Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 257-262, IEEE Computer Society, 2006. [doi]
Abstract is missing.